{"title":"A test language for avionics system","authors":"Yanfang Liu, J. Lv, Wei Wang, Tao Li, Shilong Ma","doi":"10.1109/ICSESS.2017.8342857","DOIUrl":null,"url":null,"abstract":"In this paper, we proposed an automated test framework, logical test device which makes complex avionics systems transparent and jump machines which ensure data security of SUT (System Under Test). Based on this test framework, we mainly proposed a universal test language for avionics systems. The key feature of our test language is to introduce device type data and device collaboration operations which support automatic collaboration between logical test device and jump machines, meanwhile make test language more universal. This test language has been applied to the actual avionics system testing in China Academy of Electronics and Information Technology. Relative to avionics system testing before automation, our test language changes work pattern of avionics system testing and improves the test efficiency.","PeriodicalId":179815,"journal":{"name":"2017 8th IEEE International Conference on Software Engineering and Service Science (ICSESS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 8th IEEE International Conference on Software Engineering and Service Science (ICSESS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSESS.2017.8342857","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we proposed an automated test framework, logical test device which makes complex avionics systems transparent and jump machines which ensure data security of SUT (System Under Test). Based on this test framework, we mainly proposed a universal test language for avionics systems. The key feature of our test language is to introduce device type data and device collaboration operations which support automatic collaboration between logical test device and jump machines, meanwhile make test language more universal. This test language has been applied to the actual avionics system testing in China Academy of Electronics and Information Technology. Relative to avionics system testing before automation, our test language changes work pattern of avionics system testing and improves the test efficiency.