Wavelet Denoising in Industrial Tomography

Ivan B. Silva, M. R. Petraglia, A. Petraglia
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Abstract

In recent decades computed tomography (CT) has become a well established technique in non-destructive testing (NDT) approaches for accurate views of external and internal component structures. During the acquisition phase, many artifacts may adversely affect the quality of the sample edge estimation and interfere with surface detection. Their accuracies are important for metrology and correct volume visualization. In particular, the artifacts caused by the scatter radiation can be substantially strong, depending on the sample material and the geometry. In this paper we present a study on the use of wavelet denoising techniques to reduce the impact of such artifacts. The acquired images are filtered before the 3D reconstruction process. The reconstructed volumes are analised with the purpose of evaluating the influence of the denoising process, aiming at a better visual quality and more precise surfaces determination.
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工业层析成像中的小波去噪
近几十年来,计算机断层扫描(CT)已成为无损检测(NDT)方法中一种成熟的技术,用于准确观察外部和内部构件结构。在采集阶段,许多伪影可能会对样本边缘估计的质量产生不利影响,并干扰表面检测。它们的精度对计量和正确的体积可视化非常重要。特别是,由散射辐射引起的伪影可能非常强,这取决于样品材料和几何形状。在本文中,我们提出了一个研究使用小波去噪技术,以减少这种伪影的影响。在进行三维重建之前,对采集的图像进行滤波处理。对重建体进行分析,评估去噪过程的影响,以获得更好的视觉质量和更精确的表面确定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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