Conventional testing in times of IEC61850

R. Eick, J. Jenkner, Benno Hornischer, Frank Hergeroeder
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Abstract

With the advent of IEC61850 standardization, increasingly more power utilities adopt a standardized environment with modern Intelligent Electronic Devices (IEDs) in their substations. As a consequence, conventional test procedures face a future of uncertainty, and established testing routines are called into question. The functionalities and new protection system arrangements of IEDs cause changes in maintenance routines which imply re-thinking of protective panel design. The authors identify existing requirements and how they influence panel design and evaluate to what degree new technologies affect the use of traditional test interfaces for relay testing.
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符合IEC61850标准的常规测试
随着IEC61850标准的出现,越来越多的电力公司在其变电站采用现代智能电子设备(ied)的标准化环境。因此,传统的测试程序面临着未来的不确定性,既定的测试程序受到质疑。简易爆炸装置的功能和新的保护系统安排导致维修程序的变化,这意味着重新考虑保护面板的设计。作者确定了现有的需求以及它们如何影响面板设计,并评估了新技术对继电器测试的传统测试接口使用的影响程度。
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