Improved Damage Modeling for Solder Joints under Combined Vibration and Temperature Cycling Loading

R. Höhne, K. Meier, A. Dasgupta, D. Leslie, K. Bock
{"title":"Improved Damage Modeling for Solder Joints under Combined Vibration and Temperature Cycling Loading","authors":"R. Höhne, K. Meier, A. Dasgupta, D. Leslie, K. Bock","doi":"10.1109/ECTC32696.2021.00218","DOIUrl":null,"url":null,"abstract":"In this work, fatigue damage caused to solder joints in printed wiring assemblies due to the superposition of harmonic vibration and temperature is studied along with different damage superposition approaches. In this work, a non-linear interactive damage superposition method is used, with temperature-dependent vibration damage coefficients that are interpolated from isothermal vibration experiments at selected temperatures. The temperature range −40°C to 125 °C was segmented into multiple sub-segments for this interpolation. By applying these measures, a new procedure for an improved incremental damage superposition approach (IDSA) was developed in this work. This new procedure was then used to superpose the vibration and temperature cycling loads to forecast the fatigue life of SAC105 solder joints for leadless chip resistors under simultaneous vibration and temperature cycling loads. Potential failure sites of the solder joint have been successfully investigated by utilizing this new procedure. Using the developed model, accelerated testing profiles are designed such that the vibration fatigue and temperature cycling fatigue damage are comparable and cause failure in approximately 250 temperature cycles.","PeriodicalId":351817,"journal":{"name":"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC32696.2021.00218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

In this work, fatigue damage caused to solder joints in printed wiring assemblies due to the superposition of harmonic vibration and temperature is studied along with different damage superposition approaches. In this work, a non-linear interactive damage superposition method is used, with temperature-dependent vibration damage coefficients that are interpolated from isothermal vibration experiments at selected temperatures. The temperature range −40°C to 125 °C was segmented into multiple sub-segments for this interpolation. By applying these measures, a new procedure for an improved incremental damage superposition approach (IDSA) was developed in this work. This new procedure was then used to superpose the vibration and temperature cycling loads to forecast the fatigue life of SAC105 solder joints for leadless chip resistors under simultaneous vibration and temperature cycling loads. Potential failure sites of the solder joint have been successfully investigated by utilizing this new procedure. Using the developed model, accelerated testing profiles are designed such that the vibration fatigue and temperature cycling fatigue damage are comparable and cause failure in approximately 250 temperature cycles.
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振动和温度循环复合载荷下焊点损伤模型的改进
本文采用不同的损伤叠加方法,研究了谐波振动和温度叠加对印刷线材焊点造成的疲劳损伤。在这项工作中,使用了一种非线性交互损伤叠加方法,该方法与温度相关的振动损伤系数是在选定温度下的等温振动实验中插值的。温度范围- 40°C至125°C被分割成多个子段进行插值。在此基础上,提出了一种改进的增量损伤叠加法(IDSA)。利用该方法对振动和温度循环载荷进行叠加,预测了无引线片式电阻SAC105焊点在振动和温度循环载荷作用下的疲劳寿命。利用这种新方法成功地研究了焊点的潜在失效部位。利用开发的模型,设计了加速测试剖面,使振动疲劳和温度循环疲劳损伤具有可比性,并且在大约250个温度循环中导致失效。
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