Effect of interface roughness and morphology on the electrical behaviour of Au/n-GaAs Schottky diodes

Z. Horváth, O.V. Rengevich, S. Mamykin, N. Dmitruk, V. Van Tuyen, B. Szentpáli, R. Konakova, A. Belyaev
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Abstract

The effect of the interface roughness and morphology (flat, dendrite-like and quasi-grating) on the electrical behaviour of Au/n-GaAs Schottky diodes were studied by current-voltage measurements. The results suggested that diodes with a dendrite-like interface consist of two phases with different barrier heights, while the current flow through diodes with a quasi-grating interface were dominated by tunneling. Both types of diodes with rough interface exhibited excess currents at low temperatures.
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界面粗糙度和形貌对Au/n-GaAs肖特基二极管电学行为的影响
通过电流-电压测量研究了界面粗糙度和形貌(平面、枝晶状和准光栅)对Au/n-GaAs肖特基二极管电学行为的影响。结果表明,具有枝晶状界面的二极管由具有不同势垒高度的两相组成,而具有准光栅界面的二极管电流以隧穿为主。两种具有粗糙界面的二极管在低温下均表现出过量电流。
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