Understanding of within Chip variation of optical appearance of Aluminum Pads

L. W. Lee, M. Stefenelli, Agala Joel Baldevia, N. Evelyn
{"title":"Understanding of within Chip variation of optical appearance of Aluminum Pads","authors":"L. W. Lee, M. Stefenelli, Agala Joel Baldevia, N. Evelyn","doi":"10.1109/EPTC.2018.8654354","DOIUrl":null,"url":null,"abstract":"An electro assisted advanced adhesion promoter process is used to increase the mechanical and chemical robustness between mold compound and metal areas in the package [1], [2]. As quality monitoring method optical inspection is used. Where, for one product, a significant color difference between bond pads within a chip was observed. Our investigations proved that the color differences after the plating process are mainly due to the electrical characteristic of the specific chip in the specific product leading to electronegative static charge on individual bond pads.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

An electro assisted advanced adhesion promoter process is used to increase the mechanical and chemical robustness between mold compound and metal areas in the package [1], [2]. As quality monitoring method optical inspection is used. Where, for one product, a significant color difference between bond pads within a chip was observed. Our investigations proved that the color differences after the plating process are mainly due to the electrical characteristic of the specific chip in the specific product leading to electronegative static charge on individual bond pads.
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了解铝片光学外观在芯片内部的变化
采用电子辅助的高级附着力促进剂工艺来增加模具化合物和封装[1],[2]中金属区域之间的机械和化学坚固性。采用光学检测作为质量监控手段。其中,对于一种产品,观察到芯片内键合垫之间的显着色差。我们的研究证明,电镀过程后的颜色差异主要是由于特定产品中特定芯片的电气特性导致单个键垫上的电负性静电荷。
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