{"title":"Enhanced crosstalk fault model and methodology to generate tests for arbitrary inter-core interconnect topology","authors":"Wichian Sirisaengtaksin, S. Gupta","doi":"10.1109/ATS.2002.1181705","DOIUrl":null,"url":null,"abstract":"In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181705","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.