Development of scanning acoustic microscopy method with passive integration package for mass production monitoring

C. Tai, C. Y. Lai, Eswariy Subramanian
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Abstract

Scanning Acoustic Microscopy (SAM) is a nondestructive method to investigate delamination in packages. However, increasing of integrated function and new material applied into package had posted some challenges in SAM surveillance and analysis. Integration of passive component in moulded packaging has contributed to more complicated analysis for package delamination inspection. Furthermore, introducing of high silver filler die attach material into moulded packaging for passive component bonding have leading confusion on the SAM results interpretation as compare to the usual practice. The new “moon shape” delamination signal observed with white colour contrast normally will be interpreted as a delamination defect under normal SAM image interpretation. However, further cross section analysis and coupled with FIB cut has confirmed that the delamination defect is not genuine. This phenomenon is causing some confusion for operator to differential the real defect sample as compare to the standard production packages. In order to clear the confusion as observed, new sample preparation methodology and scanning apparatus has been introduce for delamination results verification. Pre-sample preparation by partially removing the package backside mould compound had improved the SAM image clarity for easy interpretation. Further experiment with high frequency and short focal length transducers scanning have successfully clear the doubt as observe earlier. The details of the scanning methodology and apparatus applied will be describing details in this paper.
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用于批量生产监测的被动集成扫描声显微镜方法的开发
扫描声学显微镜(SAM)是一种无损的方法来研究分层包装。然而,集成功能的增加和新材料在封装中的应用给SAM的监测和分析带来了一些挑战。模塑封装中无源元件的集成使得封装分层检测分析变得更加复杂。此外,在模制封装中引入高银填充物,用于被动元件粘合,与通常的做法相比,会导致SAM结果解释的混乱。用白色对比观察到的新的“月亮状”分层信号在正常的SAM图像解释下通常会被解释为分层缺陷。然而,进一步的截面分析并结合FIB切割证实了分层缺陷不是真的。这种现象给操作人员造成了一些混淆,难以区分真正的缺陷样品与标准生产包装。为了消除所观察到的混淆,引入了新的样品制备方法和扫描设备来验证分层结果。通过部分去除包装背面模具化合物的预样品制备提高了SAM图像的清晰度,便于解释。进一步的高频短焦距换能器扫描实验成功地消除了前面观察到的疑问。详细的扫描方法和设备将在本文中详细描述。
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