{"title":"Innovation in test: where are we","authors":"R. Rajsuman","doi":"10.1109/DELTA.2006.59","DOIUrl":null,"url":null,"abstract":"In this paper, key recent innovations with respect to all major segments of the test industry are discussed. These innovations do not provide incremental improvement; they change the paradigm impacting the productivity and cost by orders of magnitude. The objective is to provide guidance for academic and industrial researchers for these new grounds.","PeriodicalId":439448,"journal":{"name":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2006.59","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, key recent innovations with respect to all major segments of the test industry are discussed. These innovations do not provide incremental improvement; they change the paradigm impacting the productivity and cost by orders of magnitude. The objective is to provide guidance for academic and industrial researchers for these new grounds.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
