Extreme Value Based Estimation of Critical Single Event Failure Probability

G. Zebrev, A. M. Galimov, R. G. Useinov, I. Fateev
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引用次数: 1

Abstract

A new survival probability function of ICs under space ion impact is proposed. Unlike the conventional approach, the function is based on the extreme value statistics which is relevant to the critical single event effects.
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基于极值的临界单事件失效概率估计
提出了一种新的集成电路在空间离子冲击下的生存概率函数。与传统方法不同,该函数基于与关键单事件效应相关的极值统计量。
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