J. Kallis, L. B. Duncan, S. Laub, M. J. Little, L.M. Miani, D.C. Sandkulla
{"title":"Reliability of the 3-D computer under stress of mechanical vibration and thermal cycling","authors":"J. Kallis, L. B. Duncan, S. Laub, M. J. Little, L.M. Miani, D.C. Sandkulla","doi":"10.1109/WAFER.1989.47537","DOIUrl":null,"url":null,"abstract":"An assessment of the mechanical reliability of the 3-D Computer is presented. The purpose of this reliability assessment was to gain confidence in the feasibility of this stacked-wafer approach for space-based applications. The investigation addressed both the mechanical and thermal reliability by means of analyses and experiments.<<ETX>>","PeriodicalId":412685,"journal":{"name":"[1989] Proceedings International Conference on Wafer Scale Integration","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-01-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1989] Proceedings International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WAFER.1989.47537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
An assessment of the mechanical reliability of the 3-D Computer is presented. The purpose of this reliability assessment was to gain confidence in the feasibility of this stacked-wafer approach for space-based applications. The investigation addressed both the mechanical and thermal reliability by means of analyses and experiments.<>