Yan Huang, Panpan Jiang, Tianhan Liu, Chaohui Liang
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引用次数: 0
Abstract
In this article, EOS-induced failures of three FPGAs due to the severe voltage over or under shoots during debugging process are analyzed, based on well designed procedures. The traditional techniques used are capable to pinpoint and characterize the details of EOS-induced failures, this may assist the manufacturers and users to do the provenance-tracking and improve the reliability of FPGAs application.
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