{"title":"Eye prediction of digital driver with power distribution network noise","authors":"Chiu-Chih Chou, Hao-Hsiang Chuang, Tzong-Lin Wu, Shih-Hung Weng, Chung-Kuan Cheng","doi":"10.1109/EPEPS.2012.6457859","DOIUrl":null,"url":null,"abstract":"Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.","PeriodicalId":188377,"journal":{"name":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2012.6457859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.
为了取代信道设计中耗时的随机比特模拟,提出了快速准确估计最坏情况眼图的算法。然而,当考虑到非线性I/O电路和配电网络(PDN)噪声之间的相互作用时,大多数方法都无法保持精度。基于SMBP (superposition of multiple bit pattern responses)的概念,Ren和Oh[1]开发了一种快速预测眼图的算法,理论上可以捕捉电路中的任何非线性。本文构造了一个带有PDN的测试电路来检验该算法的性能。实验结果与HSPICE长PRBS模拟结果吻合较好。