W. H. Newman, N. V. van Vonno, A. Robinson, S. D. Turner, L. Pearce, E. Thomson
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引用次数: 0
Abstract
We report the results of total ionizing dose (TID) and destructive and nondestructive single-event effects (SEE) testing of the Intersil ISL72814SEH and ISL73814SEH radiation hardened, high-voltage, high-current, driver circuits.
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