Static test compaction for transition faults under the hazard-based detection conditions

I. Pomeranz
{"title":"Static test compaction for transition faults under the hazard-based detection conditions","authors":"I. Pomeranz","doi":"10.1109/VTS.2012.6231099","DOIUrl":null,"url":null,"abstract":"The conventional detection conditions for transition faults require a transition at the fault site for activating a fault. The hazard-based detection conditions allow a transition fault to be activated by a pulse. Earlier, the hazard-based detection conditions were used for obtaining more accurate estimates of transition fault coverage and for more accurate defect diagnosis. This paper considers their use for test compaction. The procedure described in this paper replaces the conventional detection conditions with the hazard-based detection conditions for some faults. The use of the hazard-based detection conditions allows each test to detect more faults, thus allowing the number of tests to be reduced.","PeriodicalId":169611,"journal":{"name":"2012 IEEE 30th VLSI Test Symposium (VTS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 30th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2012.6231099","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

The conventional detection conditions for transition faults require a transition at the fault site for activating a fault. The hazard-based detection conditions allow a transition fault to be activated by a pulse. Earlier, the hazard-based detection conditions were used for obtaining more accurate estimates of transition fault coverage and for more accurate defect diagnosis. This paper considers their use for test compaction. The procedure described in this paper replaces the conventional detection conditions with the hazard-based detection conditions for some faults. The use of the hazard-based detection conditions allows each test to detect more faults, thus allowing the number of tests to be reduced.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于危害检测条件下的过渡故障静态压实试验
传统的过渡性故障检测条件要求在故障点发生过渡性故障才能触发故障。基于危险的检测条件允许通过脉冲激活过渡故障。早先,基于危险的检测条件被用于获得更准确的过渡故障覆盖估计和更准确的缺陷诊断。本文考虑了它们在试验压实中的应用。本文所描述的过程用基于危害的故障检测条件代替了传统的故障检测条件。使用基于危险的检测条件允许每次测试检测更多的故障,从而允许减少测试的数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Derating based hardware optimizations in soft error tolerant designs Exploiting X-correlation in output compression via superset X-canceling SAT-ATPG using preferences for improved detection of complex defect mechanisms Smart selection of indirect parameters for DC-based alternate RF IC testing Write-through method for embedded memory with compression Scan-based testing
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1