{"title":"Signature analysis for sequential circuits with reset","authors":"A. P. Stroele","doi":"10.1109/EDTC.1994.326889","DOIUrl":null,"url":null,"abstract":"When test responses are compacted, even some erroneous response sequences can lead to the error-free signature. This phenomenon of aliasing has been studied thoroughly using the assumption that errors in successive responses are statistically independent. In this paper signature analysis and aliasing are investigated for the test responses of sequential circuits with reset where errors can be correlated both in space and time. The probability of aliasing in a signature analyzer with an irreducible characteristic polynomial of degree k tends to 2/sup /spl minus/k/ as test lengths increase.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326889","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
When test responses are compacted, even some erroneous response sequences can lead to the error-free signature. This phenomenon of aliasing has been studied thoroughly using the assumption that errors in successive responses are statistically independent. In this paper signature analysis and aliasing are investigated for the test responses of sequential circuits with reset where errors can be correlated both in space and time. The probability of aliasing in a signature analyzer with an irreducible characteristic polynomial of degree k tends to 2/sup /spl minus/k/ as test lengths increase.<>
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