{"title":"Study of Re, Au, and Fe dopant effect on the structure and optical properties of molybdenum disulfide single crystals","authors":"Sigiro Mula, Ho Ching-Hwa","doi":"10.1109/ICIPRM.2016.7528820","DOIUrl":null,"url":null,"abstract":"We report on extensive structural and optical studies of a variety of pure and Re-, Au-, Fe-doped molybdenum disulfide (MoS2) single crystals which grown by chemical vapor transport (CVT) method. In order to compare structural properties of crystals with different doping we conducted X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements. For optical characterization we used Raman spectroscopy, piezoreflectance (PzR), electrolyte electroreflectance (EER) and photoconductivity (PC).","PeriodicalId":357009,"journal":{"name":"2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.2016.7528820","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We report on extensive structural and optical studies of a variety of pure and Re-, Au-, Fe-doped molybdenum disulfide (MoS2) single crystals which grown by chemical vapor transport (CVT) method. In order to compare structural properties of crystals with different doping we conducted X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements. For optical characterization we used Raman spectroscopy, piezoreflectance (PzR), electrolyte electroreflectance (EER) and photoconductivity (PC).
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