Experimental design for tensile tests on PCB copper traces for board level packaging

S. Wiese, D. Bruch, M. Elasmi, F. Kraemer, J. Ahmar
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引用次数: 6

Abstract

This paper presents an approach to adequately design a test setup and specimen in order to perform tensile tests on PCB copper traces for board level packaging. The difficulty to conduct tensile tests on thin pcb copper traces is caused by the requirements of representative specimens. Most of the failure sites on copper interconnect structures in electronic assemblies are characterised by a high aspect ratio between the thickness and width. While the width is on the range of some hundred micrometres to a few millimetres, typical thicknesses are between 1 to 100 micrometres. Therefore specimens that adequately represent the properties of pcb copper are difficult to test in a standard mechanical test setup, which is usually made for compact specimens. The experimental design for determining the deformation behaviour of the PCB copper trace material encompasses two aspects: (1) experimental setup design and (2) specimen design. The two aspects contribute to the accuracy of the later material model for the use in FEM simulation. In order to conduct tests on thin copper film specimens, a test setup was designed, which is characterized by higher compliance of its frame. This way the test setup is able to compensate for misaligned angles of the sample to the load axis of the setup. An optical measurement is used in order provide accurate strain measurements on the sample. The role of specimen design of thin copper foil specimens is crucial for the accuracy of the test. FEM simulations of stress distributions have been carried out on classical dog bone specimens and on stripe specimens. The paper will discuss the inhomogeneous stress distributions of the gauge length of the stripe specimen compared to the dog bone specimen. Another aspect is the sample preparation. The paper will report the difficulties that exist, when the specimen is prepared by milling a copper sheet. The paper will discuss the connection between test setup design and specimen design with respect to the effects on the results of a tensile test on thin copper specimens.
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板级封装用PCB铜线拉伸试验设计
本文提出了一种充分设计测试装置和样品的方法,以便对电路板级封装的PCB铜迹进行拉伸测试。对薄型pcb铜线进行拉伸试验的困难是由代表性试样的要求造成的。电子组件中铜互连结构的大部分失效部位的特征是厚度与宽度之间的高纵横比。虽然宽度在几百微米到几毫米的范围内,但典型的厚度在1到100微米之间。因此,充分代表pcb铜的性能的样品很难在标准的机械测试装置中进行测试,这通常是为紧凑的样品制作的。确定PCB铜微量材料变形行为的实验设计包括两个方面:(1)实验装置设计和(2)试样设计。这两个方面有助于后期材料模型在有限元模拟中使用的准确性。为了对铜薄膜试样进行试验,设计了一种机架柔度较高的试验装置。这样,测试装置就能够补偿样品与装置负载轴的不对齐角度。为了对样品进行精确的应变测量,使用了光学测量。薄铜箔试样的试样设计对试验的准确性起着至关重要的作用。对经典犬骨试件和条纹试件的应力分布进行了有限元模拟。本文将讨论条纹试件与犬骨试件的非均匀应力分布。另一个方面是样品制备。本文将报告存在的困难,当试样是通过铣削铜片制备。本文将讨论试验装置设计和试样设计之间的联系,以及对薄铜试样拉伸试验结果的影响。
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