Acceleration of life prediction of solder joints using multi-failure criteria

K. Jankowski, A. Wymyslowski
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Abstract

Occurring from many years a impetuous growth of electronic devices manufacturing, induced by introducing a new functionalities for customers and moving towards replacing hazardous substances such as lead in electrical and electronic equipment caused that a reliability of solder joints is more important issue in electronic assembly. Reliability of solder joints plays a major role in the electronic packaging. Indeed, the solder joints serve not only for the transmitting of electrical signals, but also for the heat transportation and as a structural support which is one of the most important aspects. Therefore very important is to estimate behavior of solder joints in various work conditions. The best way to solve that problem is to take a focus on creep and fatigue phenomena which initiate degradation process. Currently creep and fatigue phenomena are considered only in self-dependent way. Consequently reliability prototyping is long lasting and expensive. The usual tests take advantage of only one dominating failure mode which can last even for a number of months. In addition all failure analysis are done under the simplified conditions what means that obtained results are not properly reliable. To accelerate that kind of tests creep and fatigue phenomena should be taken into account at the same time [1]. That combination can help to develop analytical, experimental and numerical approach for understanding the combined multi-loading and multi-failure problem. Therefore an appropriate understanding and development of analytical methods and experimental tools for multi-failure criteria analysis could be very helpful. The study will present new method, which allow introduce multi-failure conditions to tested joints.
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利用多失效准则加速焊点寿命预测
多年来,电子设备制造业的迅猛发展,是由于为客户引入新功能和转向取代电气和电子设备中的铅等有害物质,导致焊点的可靠性成为电子组装中更重要的问题。焊点的可靠性在电子封装中起着重要的作用。事实上,焊点不仅起到传递电信号的作用,而且起到传递热量和作为结构支撑的作用,这是最重要的方面之一。因此,评估焊点在各种工作条件下的性能是非常重要的。解决这一问题的最佳途径是关注引发退化过程的蠕变和疲劳现象。目前对蠕变和疲劳现象的研究都是独立的。因此,可靠性原型是持久和昂贵的。通常的测试只利用一种主要的故障模式,这种模式甚至可以持续几个月。此外,所有的失效分析都是在简化的条件下进行的,这意味着得到的结果不是很可靠。为了加速这类试验,应同时考虑蠕变和疲劳现象[1]。这种结合有助于发展分析、实验和数值方法来理解组合多载荷和多破坏问题。因此,正确理解和发展多失效准则分析的分析方法和实验工具是非常有益的。该研究将提出一种新的方法,允许对被测接头引入多种失效条件。
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