NA008 Deposition temperature dependence of YBCO transport properties

Abstract

In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7¿¿ (YBCO) thin films in applied field (Jcin-field). We found that the Jcin-field increases as the deposition temperature increases (775°C ¿ 825°C) for the samples grown on both SrTiO3 (STO) and LaAlO3 substrates. An interesting linear relation is observed between the SF density and the Jcin-field value, which suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.