Tensile Straightening of Superfine Wire and Residual Stress Measurement Using Focused Ion Beam

Tsutomu Yamashita, Kazunari Yoshida
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引用次数: 5

Abstract

The general method of reducing curving or bending for midsize wires or sheets is straightening using rollers and / or levelers. For superfine wires, similarly, high straightness is needed. However, it is very di ffi cult to deal with superfine wires due to their fineness and low tensile strength. In our study, warm tensile straightening processes for superfine gold wire, which is widely used as bonding material between leads and IC chips in semiconductors, were examined. Furthermore, finite element analyses of drawing and tensile straightening of superfine wires were carried out. The correlation between straightness and axial residual stress, which was calculated using the curve width when half of the wire was removed by sputtering with a focused ion beam (FIB), was studied. As a result of our studies, the improvement of straightness by tensile straightening of superfine gold wire was demonstrated, and the relationship between axial residual stress and straightness of wires was clarified.
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超细丝拉伸矫直及聚焦离子束残余应力测量
一般的方法减少弯曲或弯曲为中等大小的电线或板是矫直使用辊和/或矫直机。对于超细线材,同样需要高直线度。然而,由于超细丝的细度和低抗拉强度,处理超细丝非常困难。在我们的研究中,研究了在半导体中广泛用作引线和IC芯片之间的粘合材料的超细金线的热拉伸矫直工艺。在此基础上,对超细丝的拉拔和拉伸矫直进行了有限元分析。利用聚焦离子束溅射去除一半金属丝时的曲线宽度计算了金属丝直线度与轴向残余应力之间的关系。研究结果表明,拉伸矫直可以提高超细金丝的直线度,并阐明了轴向残余应力与金属丝直线度的关系。
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