{"title":"Transition count based BIST for detecting multiple stuck-open faults in CMOS circuits","authors":"H. Rahaman, D. Das, B. B. Bhattacharya","doi":"10.1109/APASIC.2000.896969","DOIUrl":null,"url":null,"abstract":"This paper presents a BIST design suitable for detecting multiple stuck-open faults in two-level CMOS single complex cells. The test pattern generator (TPG) generates a sequence of length 2n.2/sup n/ that includes all n.2/sup n/ single-input-change (SIC) ordered test pairs for an n-input circuit under test (CUT). The signature analyzer (SA) counts the number of alternate transitions at the output. Design of the corresponding TPG and SA is straightforward.","PeriodicalId":313978,"journal":{"name":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.2000.896969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
This paper presents a BIST design suitable for detecting multiple stuck-open faults in two-level CMOS single complex cells. The test pattern generator (TPG) generates a sequence of length 2n.2/sup n/ that includes all n.2/sup n/ single-input-change (SIC) ordered test pairs for an n-input circuit under test (CUT). The signature analyzer (SA) counts the number of alternate transitions at the output. Design of the corresponding TPG and SA is straightforward.
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