Demystifying the effect of hydrogen treatment on silicon photovoltaics

Govind Nanda, Sara M. Almenabawy, R. Prinja, G. Sharma, N. Kherani
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Abstract

Interactions between hydrogen and silicon play an integral role in determining the quality of surface and bulk passivation of various device structures in silicon photovoltaics. The efficacy of a hydrogen treatment method is known to be dependent on whether the interacting hydrogen species is atomic, ionic, or molecular. Furthermore, these concentrations can be altered by controlling the substrate temperature of the silicon substrate. Moreover, an important consideration is the time and atmosphere the treatment is carried out in, as it influences the desorption of hydrogen from silicon. Hence, it is important to undertake a comprehensive investigation of both the theoretical and experimental aspects of hydrogen passivation of silicon devices, thereby developing a clear understanding of how hydrogen behaves within different solar cell structures, and its dependence on substrate properties. In the theoretical study presented, we assume that the total concentration of hydrogen in the silicon substrate does not remain constant when temperature is increased, and that longer exposures to higher temperatures may cause further loss of hydrogen. This will be augmented by experimental studies of a-Si passivation layers on silicon subjected to hydrogen treatments and follow-on stepwise annealing with resulting loss of hydrogen and examination of its effect on the minority carrier lifetime.
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揭开氢处理对硅光伏的影响
氢和硅之间的相互作用在决定硅光伏中各种器件结构的表面和体钝化质量方面起着不可或缺的作用。已知氢处理方法的功效取决于相互作用的氢是原子的、离子的还是分子的。此外,这些浓度可以通过控制硅衬底的衬底温度来改变。此外,一个重要的考虑因素是进行处理的时间和气氛,因为它会影响氢从硅中的解吸。因此,重要的是对硅器件的氢钝化的理论和实验方面进行全面的研究,从而清楚地了解氢在不同太阳能电池结构中的行为,以及它对衬底性质的依赖。在提出的理论研究中,我们假设当温度升高时,硅衬底中氢的总浓度不会保持不变,并且长时间暴露在较高的温度下可能会导致氢的进一步损失。这将通过对经过氢处理的硅上的a-Si钝化层的实验研究和随后的逐步退火来增强,从而导致氢的损失,并检查其对少数载流子寿命的影响。
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