{"title":"Low cost test solution for IDDQ","authors":"B. Thomas, R. Andlauer","doi":"10.1109/IDDQ.1996.557813","DOIUrl":null,"url":null,"abstract":"This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.","PeriodicalId":285207,"journal":{"name":"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1996 IEEE International Workshop on IDDQ Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDDQ.1996.557813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.
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