{"title":"A New Macromodeling Approach for Digital Output Drivers and Application in Simultaneous Switching Noise Analysis","authors":"B. Buhrow, E. Daniel, B. Gilbert","doi":"10.1109/EPEP.2007.4387175","DOIUrl":null,"url":null,"abstract":"Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"106 4 Suppl 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Output driver models play a critical role in simultaneous switching noise (SSN) analysis. However, their accuracy must often be compromised with simplicity of implementation for large scale SSN simulations. We present an approach for creating simple, fast, and accurate macromodels of output drivers. To demonstrate their usefulness, simulation results in multi-IO SSN simulations are shown and compared to those obtained from transistor level SPICE libraries.
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