{"title":"An Improved Open for Calibrating Sexed VANA Test Ports","authors":"G. Simpson","doi":"10.1109/ARFTG.1986.323667","DOIUrl":null,"url":null,"abstract":"The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1986.323667","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.
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