{"title":"Compendium of Radiation-Induced Effects on µProcessors","authors":"G. Tsiligiannis, S. Danzeca, A. Masi","doi":"10.1109/radecs47380.2019.9745694","DOIUrl":null,"url":null,"abstract":"In this paper, we analyze the sensitivity of four ARM-based microprocessors under Proton induced radiation. The purpose of the study is to explore the reliability limitations of these devices under the CERN radiation environment.","PeriodicalId":269018,"journal":{"name":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/radecs47380.2019.9745694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we analyze the sensitivity of four ARM-based microprocessors under Proton induced radiation. The purpose of the study is to explore the reliability limitations of these devices under the CERN radiation environment.
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