{"title":"Sensitivity approach to statistical signal integrity analysis of coupled interconnect trees","authors":"Zhigang Hao, G. Shi","doi":"10.1109/MWSCAS.2009.5236114","DOIUrl":null,"url":null,"abstract":"Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.","PeriodicalId":254577,"journal":{"name":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 52nd IEEE International Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2009.5236114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Capacitive and inductive coupling issues are hard to analyze in general; however, they are critical for signal integrity (SI) analysis in the contemporary integrated circuit technology. This paper presents a sensitivity based computation approach to coupled RLC trees for statistical signal integrity analysis. This technique is intended for use in SI-driven placement and routing.