{"title":"Reducing EOS current in hot bar process in manufacturing of fiber optics components","authors":"J. Salisbury, V. Kraz","doi":"10.1109/EOSESD.2016.7592544","DOIUrl":null,"url":null,"abstract":"Excessive ground currents expose sensitive devices to electrical overstress (EOS) in a hot bar soldering process. This paper examines the process, current and voltage exposure to the devices as well as describes mitigation methods to reduce this current, which are applicable to many processes in semiconductor manufacturing and PCB assembly.","PeriodicalId":239756,"journal":{"name":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2016.7592544","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Excessive ground currents expose sensitive devices to electrical overstress (EOS) in a hot bar soldering process. This paper examines the process, current and voltage exposure to the devices as well as describes mitigation methods to reduce this current, which are applicable to many processes in semiconductor manufacturing and PCB assembly.
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