{"title":"Variability Evaluation of MOS-gated PNPN Diode for Hardware Spiking Neural Network","authors":"Toshihiro Takada, Takayuki Mori, J. Ida","doi":"10.1109/ICMTS55420.2023.10094054","DOIUrl":null,"url":null,"abstract":"The variability of the neuronal function device of a metal oxide semiconductor-gated PNPN diode was evaluated. The variability of neurons is known to affect the inference accuracy of spiking neural networks (SNNs). The device has stochastic operation on its own, and the spike frequency can be controlled by the gate voltage, which has the possibility to improve the accuracy of SNNs.","PeriodicalId":275144,"journal":{"name":"2023 35th International Conference on Microelectronic Test Structure (ICMTS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 35th International Conference on Microelectronic Test Structure (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS55420.2023.10094054","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The variability of the neuronal function device of a metal oxide semiconductor-gated PNPN diode was evaluated. The variability of neurons is known to affect the inference accuracy of spiking neural networks (SNNs). The device has stochastic operation on its own, and the spike frequency can be controlled by the gate voltage, which has the possibility to improve the accuracy of SNNs.
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