2023 35th International Conference on Microelectronic Test Structure (ICMTS)

Analysis of Critical Schottky Distance Effect and Distributed Set Voltage in HfO2-based 1T-1R Device

Pub Date : 2023-03-27 DOI: 10.1109/ICMTS55420.2023.10094175 Shih-Kai Lin, T. Chang, Wei‐Chen Huang, Yung‐Fang Tan, Chen‐Hsin Lien

Variability of MOSFET Series Resistance Extracted from Individual Devices: Is Direct Variability Measurement Possible?

Pub Date : 2023-03-27 DOI: 10.1109/ICMTS55420.2023.10094106 K. Takeuchi, T. Mizutani, T. Saraya, M. Kobayashi, T. Hiramoto

Accurate Gate Charge Modeling of HV LDMOS Transistors for Power Circuit Applications

Pub Date : 2023-03-27 DOI: 10.1109/ICMTS55420.2023.10094091 Xiaorui Jie, R. V. Langevelde, K. Xia, Lei Chao, C. McAndrew, Qilin Zhang, Matthew Bacchi, Wuxia Li