Optimizing GaN-on-Diamond Transistor Geometry for Maximum Output Power

J. Pomeroy, Martin Kuball
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引用次数: 9

Abstract

Recent thermography measurements have demonstrated the potential of GaN-on-diamond transistors to offer significantly reduced thermal resistance with respect to equivalent GaN-on-SiC devices. However, measurements performed to date have focused on smaller transistors which are not representative of larger power devices and do not take full advantage of the superior heat spreading provided by high thermal conductivity diamond substrates. In order to explore the possible gain in output power for AlGaN/GaN HEMTs on diamond substrates we have developed a parametric thermal model for optimizing the geometry of a GaN-on-diamond transistor cell. We use simulation input parameters that have been experimentally validated against measurements, giving a high confidence in the modelling results. We demonstrate that by optimizing the geometry of GaN-on-diamond transistors, combined which additional diamond heat spreading layers, a ~3× increase in total output power can be gained with respect to GaN-on-SiC.
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优化GaN-on-Diamond晶体管几何结构以获得最大输出功率
最近的热成像测量表明,相对于等效的GaN-on-SiC器件,gan -on-金刚石晶体管具有显着降低热阻的潜力。然而,迄今为止进行的测量主要集中在较小的晶体管上,这些晶体管不能代表较大的功率器件,也不能充分利用高导热金刚石基板提供的优越散热。为了探索金刚石衬底上AlGaN/GaN hemt输出功率的可能增益,我们开发了一个参数热模型来优化GaN-on-金刚石晶体管电池的几何形状。我们使用经过实验验证的模拟输入参数进行测量,从而对建模结果具有很高的置信度。我们证明,通过优化gan -on-金刚石晶体管的几何结构,加上额外的金刚石热扩散层,可以获得比GaN-on-SiC增加约3倍的总输出功率。
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