Y. Chen, J. Suehle, Chi-cheong Shen, J. Bernstein, C. Messick, P. Chaparala
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引用次数: 11
Abstract
A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant or ramped current injection breakdown tests. It is demonstrated that an accurate correlation of highly accelerated breakdown tests to long-term constant voltage TDDB tests can be obtained.
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