J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagovič
{"title":"SwissFEL KB-optics at-wavelength wavefront characterisation","authors":"J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. Wagner, C. David, M. Makita, P. Vagovič","doi":"10.1117/12.2665587","DOIUrl":null,"url":null,"abstract":"Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.","PeriodicalId":376481,"journal":{"name":"Optics + Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics + Optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2665587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
