Breakthrough of selector technology for cross-point 25-nm ReRAM

S. Kim, Jong Chul Lee, T. J. Ha, Jong Ho Lee, Jae Yeon Lee, Yong Taek Park, K. Kim, W. Ju, Younghyun Ko, H. Hwang, B. Lee, J. Y. Moon, W. Park, B. Gyun, B. Lee, D. Yim, S. Hong
{"title":"Breakthrough of selector technology for cross-point 25-nm ReRAM","authors":"S. Kim, Jong Chul Lee, T. J. Ha, Jong Ho Lee, Jae Yeon Lee, Yong Taek Park, K. Kim, W. Ju, Younghyun Ko, H. Hwang, B. Lee, J. Y. Moon, W. Park, B. Gyun, B. Lee, D. Yim, S. Hong","doi":"10.1109/IEDM.2017.8268309","DOIUrl":null,"url":null,"abstract":"In this paper, the authors report for the first time the outstanding selector performance from an innovative oxide selector. SiO2, one of conventional and common materials in semiconductor industry, was chosen as a matrix oxide material. Metal atoms which are non-mobile and easy to handle were injected into the oxide films. Off-current and threshold voltage (Vth) could be controlled by using arsenic (As), which doping method and concentration were carefully investigated to achieve threshold switching behavior. Finally ReRAM (Resistance switching Random Access Memory) cell array consisted of one selector-one resistor (1S1R) was successfully demonstrated with the full integration of the newly developed selector.","PeriodicalId":412333,"journal":{"name":"2017 IEEE International Electron Devices Meeting (IEDM)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2017.8268309","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

Abstract

In this paper, the authors report for the first time the outstanding selector performance from an innovative oxide selector. SiO2, one of conventional and common materials in semiconductor industry, was chosen as a matrix oxide material. Metal atoms which are non-mobile and easy to handle were injected into the oxide films. Off-current and threshold voltage (Vth) could be controlled by using arsenic (As), which doping method and concentration were carefully investigated to achieve threshold switching behavior. Finally ReRAM (Resistance switching Random Access Memory) cell array consisted of one selector-one resistor (1S1R) was successfully demonstrated with the full integration of the newly developed selector.
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交叉点25nm ReRAM选择器技术的突破
本文首次报道了一种新型氧化物选择器的优异性能。选择半导体工业中常用的材料之一SiO2作为基质氧化物材料。将不易移动且易于处理的金属原子注入氧化膜中。通过砷(As)的掺杂方式和掺杂浓度的研究,实现了阈值开关行为。最后成功地演示了由一个选择器-一个电阻(1S1R)组成的ReRAM(电阻开关随机存取存储器)单元阵列,并充分集成了新开发的选择器。
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