Electronic Packaging Solution for 300°C Ambience

V. Chidambaram, W. L. Ching
{"title":"Electronic Packaging Solution for 300°C Ambience","authors":"V. Chidambaram, W. L. Ching","doi":"10.1109/EPTC.2018.8654295","DOIUrl":null,"url":null,"abstract":"Niche applications in automobile and aerospace industries such as the management of integrity and operation based on the inputs from the network of sensors (e.g. pressure, accelerometer, vibration etc.) that are strategically located close to the high temperature area of the engine, requires reliable packaging solution for higher temperature regime around $300^{\\circ}\\mathrm{C}$. A unique test vehicle involving different packaging scenarios including multi-layered ceramic capacitor (MLCC), sensor device, passive component and a voltage regulator was designed and fabricated. Different types of wire bond materials, wire bond pad metallization, substrate metallization, die attach materials both conductive and non-conductive types, lid attach materials were investigated and the prospective candidates are recommended for $300^{\\circ}\\mathrm{C}$ ambience Key finding of this work are NiAuAg substrate metallization could cater for both Au and Al wire bonds. Ag sintering material is the best suited candidate for conductive die attach application, since it does not induce any thermal stresses to the components, unlike the hard solders counterpart like Au-Sn eutectic or Au-Ge eutectic. Hermeticity of the rugged package involving ceramic substrate is guaranteed by seam welding approach. Functionality of the ruggedized packages is confirmed by pre and post reliability electrical measurements. Reliability tests were carried out to confirm the selected bill of materials (BOM), function reliably at $300^{\\circ}\\mathrm{C}$ ambience.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654295","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Niche applications in automobile and aerospace industries such as the management of integrity and operation based on the inputs from the network of sensors (e.g. pressure, accelerometer, vibration etc.) that are strategically located close to the high temperature area of the engine, requires reliable packaging solution for higher temperature regime around $300^{\circ}\mathrm{C}$. A unique test vehicle involving different packaging scenarios including multi-layered ceramic capacitor (MLCC), sensor device, passive component and a voltage regulator was designed and fabricated. Different types of wire bond materials, wire bond pad metallization, substrate metallization, die attach materials both conductive and non-conductive types, lid attach materials were investigated and the prospective candidates are recommended for $300^{\circ}\mathrm{C}$ ambience Key finding of this work are NiAuAg substrate metallization could cater for both Au and Al wire bonds. Ag sintering material is the best suited candidate for conductive die attach application, since it does not induce any thermal stresses to the components, unlike the hard solders counterpart like Au-Sn eutectic or Au-Ge eutectic. Hermeticity of the rugged package involving ceramic substrate is guaranteed by seam welding approach. Functionality of the ruggedized packages is confirmed by pre and post reliability electrical measurements. Reliability tests were carried out to confirm the selected bill of materials (BOM), function reliably at $300^{\circ}\mathrm{C}$ ambience.
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300°C环境下的电子封装解决方案
汽车和航空航天工业中的小众应用,例如基于传感器网络(例如压力、加速度计、振动等)输入的完整性和操作管理,这些传感器网络战略上靠近发动机的高温区域,需要可靠的包装解决方案,用于约300^{\circ}\ maththrm {C}$的更高温度范围。设计并制造了包含多层陶瓷电容器(MLCC)、传感器器件、无源元件和稳压器等不同封装场景的独特测试车。研究了不同类型的导线键合材料,导线键合焊盘金属化,衬底金属化,导电和非导电的模具连接材料,盖连接材料,并推荐了潜在的候选材料,该工作的关键发现是NiAuAg衬底金属化可以同时满足Au和Al的导线键合。Ag烧结材料是最适合导电模具连接应用的候选材料,因为它不会对组件产生任何热应力,不像硬焊料对应的Au-Sn共晶或Au-Ge共晶。采用缝焊的方法,保证了陶瓷基板坚固封装的密封性。加固包的功能是通过前后可靠性电气测量来确认的。进行了可靠性试验,以确认所选物料清单(BOM)在$300^{\circ}\ mathm {C}$环境下的可靠性。
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