{"title":"Measurement Of The Complex Permittivity Of Microwave Materials With A Submillimeter Waveguide Four-Port Reflectometer","authors":"U. Stumper","doi":"10.1109/CPEM.1988.671221","DOIUrl":null,"url":null,"abstract":"A new four-port reflectometer for the determination of the complex relative permittivity of microwave materials at submillimeter wavelengths is described. Measurement results obtained with various low-loss solids at frequencies of about 380 GHz agree well with data taken from the literature or obtained as results of an international comparison measurement exercise.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671221","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new four-port reflectometer for the determination of the complex relative permittivity of microwave materials at submillimeter wavelengths is described. Measurement results obtained with various low-loss solids at frequencies of about 380 GHz agree well with data taken from the literature or obtained as results of an international comparison measurement exercise.
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