{"title":"Automatic synthesis of DUT board circuits for testing of mixed signal ICs","authors":"W. Kao, J. Xia","doi":"10.1109/VTEST.1993.313319","DOIUrl":null,"url":null,"abstract":"Test development is without doubt the major bottleneck in the product delivery cycle of mixed signal ICs. One of the most time consuming tasks during the test development phase is the design of the DUT board where the IC is to be inserted to run on a mixed signal tester. This paper describes a new methodology of capturing test information for an IC through test module schematics and then using an automatic tool to synthesize the final load board circuitry to be used on mixed signal ATEs.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Test development is without doubt the major bottleneck in the product delivery cycle of mixed signal ICs. One of the most time consuming tasks during the test development phase is the design of the DUT board where the IC is to be inserted to run on a mixed signal tester. This paper describes a new methodology of capturing test information for an IC through test module schematics and then using an automatic tool to synthesize the final load board circuitry to be used on mixed signal ATEs.<>
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