A. Gulin, N. Safyannikov, O. Bureneva, A. Y. Kaydanovich
{"title":"Assurance of Fault-Tolerance in Bit-Stream Computing Converters","authors":"A. Gulin, N. Safyannikov, O. Bureneva, A. Y. Kaydanovich","doi":"10.1109/EWDTS.2018.8524812","DOIUrl":null,"url":null,"abstract":"The article is devoted to the approach to the construction of original bit-stream devices, characterized by the high fault-tolerance. This property is achieved due to the original structure of the devices, fault-tolerant forms of information representation and the use of an elemental base with the high degree of technological reliability. A bit-stream multiplier-divider unit is considered as an example; its RTL description is presented. The results of the multiplier-divider unit simulation are shown; the process of the result recovery after the noise influence is presented.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2018.8524812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The article is devoted to the approach to the construction of original bit-stream devices, characterized by the high fault-tolerance. This property is achieved due to the original structure of the devices, fault-tolerant forms of information representation and the use of an elemental base with the high degree of technological reliability. A bit-stream multiplier-divider unit is considered as an example; its RTL description is presented. The results of the multiplier-divider unit simulation are shown; the process of the result recovery after the noise influence is presented.