Error analysis in surface transfer impedance measurements on shielded cables

K. Sakthivel, S.K. Das, R. Ganesan
{"title":"Error analysis in surface transfer impedance measurements on shielded cables","authors":"K. Sakthivel, S.K. Das, R. Ganesan","doi":"10.1109/ICEMIC.1999.871612","DOIUrl":null,"url":null,"abstract":"This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMIC.1999.871612","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.
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屏蔽电缆表面传递阻抗测量误差分析
本文用实验数据和图表描述了由于施加在测试电缆上的不同输入功率水平可能导致的表面传递阻抗(STI)测量误差。还描述了由于其他原因导致的错误的原因以及如何避免这些错误。最后论证了在使用该特定标准进行STI测量时应使用的适当输入功率水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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