Ling Chen, Yaman Wang, Yuchen Long, Zengfeng Duan, Yanyan Li
{"title":"Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products","authors":"Ling Chen, Yaman Wang, Yuchen Long, Zengfeng Duan, Yanyan Li","doi":"10.1109/UV56588.2022.10185477","DOIUrl":null,"url":null,"abstract":"Complex precision parts of electronic products are essential to defense information technology equipment and the manufacturing industry. The workshop testing process for electronic products is crucial to ensuring their quality is qualified. Due to its multi-breed, multi-batch, and complex structure, its experimental process design is challenged by more and more indicators and complex processes. Currently, the process of detecting complex electronic products still adopts manual process document design, which is inefficient and inconsistent, and it is difficult to guarantee accuracy by manual experience. Therefore, a new intelligent test process method is designed to complete the process design. The method first automatically extracts test indicators and related parameters from the imported unstructured technical files or sop files, then automatically matches the test indicators with the test table, then automatically fills the test parameters under each index, then clusters and outputs XML test procedures for each indicator. Moreover, the key technology of each process is studied, the intelligent test process system for complex electronic products is developed, and the application of one model of microwave component products in a military industry enterprise is used as an example. The test program generated by the system can be directly used for subsequent workshop machine execution.","PeriodicalId":211011,"journal":{"name":"2022 6th International Conference on Universal Village (UV)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 6th International Conference on Universal Village (UV)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/UV56588.2022.10185477","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Complex precision parts of electronic products are essential to defense information technology equipment and the manufacturing industry. The workshop testing process for electronic products is crucial to ensuring their quality is qualified. Due to its multi-breed, multi-batch, and complex structure, its experimental process design is challenged by more and more indicators and complex processes. Currently, the process of detecting complex electronic products still adopts manual process document design, which is inefficient and inconsistent, and it is difficult to guarantee accuracy by manual experience. Therefore, a new intelligent test process method is designed to complete the process design. The method first automatically extracts test indicators and related parameters from the imported unstructured technical files or sop files, then automatically matches the test indicators with the test table, then automatically fills the test parameters under each index, then clusters and outputs XML test procedures for each indicator. Moreover, the key technology of each process is studied, the intelligent test process system for complex electronic products is developed, and the application of one model of microwave component products in a military industry enterprise is used as an example. The test program generated by the system can be directly used for subsequent workshop machine execution.