{"title":"The influences of fault type and topology on fault model performance and the implications to test and testable design","authors":"K. Butler, M. R. Mercer","doi":"10.1109/DAC.1990.114938","DOIUrl":null,"url":null,"abstract":"A new method, difference propagation, is proposed to analyze fault models in combinational circuits. It propagates Boolean functional information represented by ordered binary decision diagrams. Results are presented concerning exact detectabilities and syndromes for a set of benchmark circuits. The data suggest answers to open questions in CAD and represent the first data of this type for bridging faults. The information is shown to affect testable design, as well as test generation.<<ETX>>","PeriodicalId":118552,"journal":{"name":"27th ACM/IEEE Design Automation Conference","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ACM/IEEE Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1990.114938","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22
Abstract
A new method, difference propagation, is proposed to analyze fault models in combinational circuits. It propagates Boolean functional information represented by ordered binary decision diagrams. Results are presented concerning exact detectabilities and syndromes for a set of benchmark circuits. The data suggest answers to open questions in CAD and represent the first data of this type for bridging faults. The information is shown to affect testable design, as well as test generation.<>
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