{"title":"Modeling of Multilayer Thick Film Components Using Time Domain Techniques","authors":"A. Y. AlMazroo, J. Toscano, A. Elshabini-Riad","doi":"10.1109/CPEM.1988.671373","DOIUrl":null,"url":null,"abstract":"A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A technique for modeling multilayer thick film components using time domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layer, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a TDR waveform is acquired. A physically based model is developed to fit the TDR information.
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