Boyon Kim, Il-Chan Park, G. Song, Wooseong Choi, Byeong-Yun Kim, Kyu-Hoon Lee, Chi-young Choi
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引用次数: 0
Abstract
Same output frequencies at each DUT of the testing circuit are multiplied by different LO frequencies signals at mixers stages, which different frequency-translated spectrums were captured at capture port simultaneously for achieving fully parallel test of RF device.
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