{"title":"1149.4 based on-line quiescent state monitoring technique [analog DFT]","authors":"C. Su, Chih-hu Wang, Wei-Juo Wang, I. Tseng","doi":"10.1109/VTEST.2003.1197651","DOIUrl":null,"url":null,"abstract":"On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.
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