Zizhen Jiang, Shimeng Yu, Yi Wu, Jesse Engel, X. Guan, H. Wong
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引用次数: 111
Abstract
We demonstrate a dynamic Verilog-A RRAM compact model capable of simulating real-time DC cycling and pulsed operation device behavior, including random variability that is inherent to RRAM. This paper illustrates the physics and capabilities of the model. The model is verified using different sets of experimental data. The DC/Pulse parameter fitting methodology are illustrated.
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