O. Turkot, F. Dall'Antonia, Richard Bean, J. E, H. Fangohr, D. E. Ferreira de Lima, S. Kantamneni, H. Kirkwood, F. Koua, A. Mancuso, D. Melo, A. Round, Egor Sobolev, R. de Wijn, James J. Wrigley, L. Gelisio
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引用次数: 2
Abstract
In this paper we introduce and discuss the EXtra-Xwiz pipeline for the semi-automated analysis of serial femtosecond crystallography data collected at the European XFEL. EXtra-Xwiz wraps the CrystFEL software suite, exposes data in a CrystFEL-compliant format, handles the interaction with the local high-performance computing cluster and simplifies certain experiment schemes such as the pump-probe one. Alongside with the integration of EXtra-Xwiz into the European XFEL ecosystem, future plans and developments are also briefly discussed.
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