{"title":"Design SRAMs for burn-in","authors":"W. Reohr, Y. Chan, D. Plass, A. Pelella, P. -. Wu","doi":"10.1109/VTEST.1993.313330","DOIUrl":null,"url":null,"abstract":"SRAM designers and product engineers must balance the diverse aspects involved in developing and manufacturing quality ICs. This paper describes how cost and complexity design techniques to improve burn-in, noting implications for performance, power and density.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"466 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
SRAM designers and product engineers must balance the diverse aspects involved in developing and manufacturing quality ICs. This paper describes how cost and complexity design techniques to improve burn-in, noting implications for performance, power and density.<>
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
