{"title":"Measurement results of on-chip IR-drop","authors":"Kazutoshi Kobayashi, Junji Yamaguchi, H. Onodera","doi":"10.1109/CICC.2002.1012897","DOIUrl":null,"url":null,"abstract":"This paper describes measurement results of on-chip IR-drop. An IR-drop measurement circuit is implemented in an LSI. It can sense the voltage drop of a power node to alter a reference voltage and clock timing. A measured waveform can be obtained automatically by using the Shmoo plot functionality of an LSI tester. Measuring two different nodes along a VDD line, differential IR-drop waveforms can be successfully obtained.","PeriodicalId":209025,"journal":{"name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2002.1012897","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper describes measurement results of on-chip IR-drop. An IR-drop measurement circuit is implemented in an LSI. It can sense the voltage drop of a power node to alter a reference voltage and clock timing. A measured waveform can be obtained automatically by using the Shmoo plot functionality of an LSI tester. Measuring two different nodes along a VDD line, differential IR-drop waveforms can be successfully obtained.
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