SW support for CCC and CQC control charts

Abstract

Statistical process control (SPC) is an approach to process control that has been widely used in any industrial or non-industrial fields. SPC is based on so called Shewhart's conception of the process variability. This conception distinguishes variability caused by obviously effected common causes from variability caused by abnormal assignable causes. New manufacturing technologies and concepts strongly contributed to the real attainment of a high level of the processes capability. In such conditions a distinction of common variability causes from assignable causes is more and more difficult. Conventional attribute control charts are not adequate solution for monitoring and control of the processes with very low level of defects (in terms of ppm). The answer can be found in the application of CCC and CQC control charts. The paper deals with the presentation of the SW application which was created to contribute to the practical deployment of these effective control charting methods in practice.